Share Email Print

Proceedings Paper

Approaches to registration using 3D surfaces
Author(s): Torre D. Zuk; M. Stella Atkins; Kellogg S. Booth
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes current iterative surface matching methods for registration, and our new extensions. Surface matching methods use two segmented surfaces as features (one dynamic and one static) and iteratively search parameter space for an optimal correlation. To compare the surfaces we use an anisotropic Euclidean chamfer distance transform, based on the static surface. This type of DT was analyzed to quantify the errors associated with it. Hierarchical levels are attained by sampling the dynamic surface at various rates. In using the reduced amount of data provided by the surface segmentation each hierarchical level is formed quickly and easily and only a single distance transform is needed, thus increasing efficiency. Our registrations were performed in a data-flow environment created for multipurpose image processing. The new modifications were tested on a large number of simulations, over a wide range of rigid body transformations and distortions. Multimodality, and multipatient registration tests were also completed. A thorough examination of these modifications in conjunction with various minimization methods was then performed. Our new approaches provide accuracy and robustness, while requiring less time and effort than conventional methods.

Paper Details

Date Published: 11 May 1994
PDF: 12 pages
Proc. SPIE 2167, Medical Imaging 1994: Image Processing, (11 May 1994); doi: 10.1117/12.175052
Show Author Affiliations
Torre D. Zuk, Univ. of British Columbia (Canada)
M. Stella Atkins, Simon Fraser Univ. (Canada)
Kellogg S. Booth, Univ. of British Columbia (Canada)

Published in SPIE Proceedings Vol. 2167:
Medical Imaging 1994: Image Processing
Murray H. Loew, Editor(s)

© SPIE. Terms of Use
Back to Top