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Proceedings Paper

Microsecond shockwave laser lithotripsy: analysis of induced absorption mechanisms
Author(s): Vladimir A. Berenberg; Il'ya B. Vitrishchak; Vladimir V. Vorontsov; Alexander G. Murzin
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Paper Abstract

Theoretical model of microsecond shockwave laser lithotripsy is developed. The destroying stone is considered to be a medium with low absorption and high scattering which contains high-absorptive organic inclusions. Laser radiation penetrates deep into such type of media and bulk destruction processes may occur in its significant volume. The distribution of energy fluence in stone volume was found in diffusion approximation. The evolution of state for each individual inclusion was studied. It was shown that the organic matter thermochemical decomposition plays an important role here. Such process leads to gas and high-absorption pyrocarbon generation. It produces sharp increasing of pore volume, cracks formation, and results shockwave generation. These processes change the state of illuminated stone layer-- lead to the formation of highly absorptive loose composition. Such layer change-- predestruction--produces conditions for the later effective transformation of laser energy. Some important dependencies for such processes were found both in simplified analytical form and numerically. Computer simulation for described model of microsecond laser lithotripsy was done with the parameters typical for ruby microsecond laser. Obtained results give the basis for the estimation of lithotripsy efficiency.

Paper Details

Date Published: 2 May 1994
PDF: 12 pages
Proc. SPIE 2129, Lasers in Urology, (2 May 1994); doi: 10.1117/12.175032
Show Author Affiliations
Vladimir A. Berenberg, S.I. Vavilov State Optical Institute (Russia)
Il'ya B. Vitrishchak, S.I. Vavilov State Optical Institute (Russia)
Vladimir V. Vorontsov, S.I. Vavilov State Optical Institute (Russia)
Alexander G. Murzin, S.I. Vavilov State Optical Institute (Russia)

Published in SPIE Proceedings Vol. 2129:
Lasers in Urology
Graham M. Watson; Rudolf W. Steiner; Douglas E. Johnson, Editor(s)

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