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Proceedings Paper

Index profile reconstruction of Ti:LiNbO3 structures and bending loss evaluation from near-field measurements
Author(s): Robert F. Tavlykaev; Karin Kueckelhaus; Edgar I. Voges
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Paper Abstract

Index profiles of Ti:LiNbO3 waveguides can efficiently be reconstructed by measuring the near-field patterns for different waveguide widths. By this, bending losses of curved waveguides can accurately be predicted. The validity of this method is verified by comparing calculated bending losses with those measured for fabricated semicircular waveguides of different bending radii.

Paper Details

Date Published: 2 May 1994
PDF: 8 pages
Proc. SPIE 2150, Design, Simulation, and Fabrication of Optoelectronic Devices and Circuits, (2 May 1994); doi: 10.1117/12.174997
Show Author Affiliations
Robert F. Tavlykaev, General Physics Institute (United States)
Karin Kueckelhaus, Univ. Dortmund (Germany)
Edgar I. Voges, Univ. Dortmund (Germany)

Published in SPIE Proceedings Vol. 2150:
Design, Simulation, and Fabrication of Optoelectronic Devices and Circuits
Mario Nicola Armenise, Editor(s)

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