Share Email Print

Proceedings Paper

Modeling of nonlinear effects in GaInAsP electroabsorption modulators
Author(s): Roberto Sabella; Paolo Lugli; Duilio Meglio; Olof Sahlen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A numerical model of bulk electroabsorption modulators has been developed. It consists of a quasi-2D representation based on a drift-diffusion approach and includes the presence of heterostructures and Fermi statistics for the carriers. The non-linear behavior of this type of device, essentially related to the pile-up and the space-charge effects, has been analyzed. Simulations results have been compared with laboratory measurements on a fabricated device that presents an abrupt heterojunction, obtaining a good agreement. Two other types of structures have been simulated, one obtained with the inclusion of a thin quaternary layer and the other with a graded heterojunction, which eliminate the hole pile-up at the InGaAsP-InP heterointerface. The paper demonstrates that it is possible to approach the optimum behavior of the modulator using both the alternatives considered here. Finally, non linear effects in short modulators has been investigated.

Paper Details

Date Published: 2 May 1994
PDF: 13 pages
Proc. SPIE 2150, Design, Simulation, and Fabrication of Optoelectronic Devices and Circuits, (2 May 1994); doi: 10.1117/12.174982
Show Author Affiliations
Roberto Sabella, Ericsson Fatme (Italy)
Paolo Lugli, Univ. di Roma Tor Vergata (Italy)
Duilio Meglio, Univ. di Roma Tor Vergata (Italy)
Olof Sahlen, Ericsson Components AB (Sweden)

Published in SPIE Proceedings Vol. 2150:
Design, Simulation, and Fabrication of Optoelectronic Devices and Circuits
Mario Nicola Armenise, Editor(s)

© SPIE. Terms of Use
Back to Top