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Proceedings Paper

Temperature changes across porcelain during multiple exposure CO2 lasing
Author(s): Joseph R. Barron; Kenneth L. Zakariasen; Larry Peacocke
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Paper Abstract

Research indicates that laser energy may provide a useful method for glazing and fusing porcelain for intraoral prosthetic purposes. However, it is not known whether such lasing will result in the production of heat levels that may be damaging to adjacent vital tissues such as the dental pulp and periodontal tissues. This research is designed to measure the magnitude of temperature rise across porcelain observed during multiple exposure C02 lasing. Fifteen porcelain examples of 1000 jim (5), 1500 pm (5) and 2000 tm (5) x each received five C02 laser exposures on the same exposure site at 1.0 sec. intervals at 8.0 watts (0.2 sec. per exposure with a 1 mm focal spot). A YSI 144201 thermilinear precision thermistor was placed on the porcelain surface opposite each laser exposure site. Temperature rise above ambient was recorded by an HP3421A data acquisition unit and HP9816 technical microcomputer. Recording continued for sufficient time to allow temperatures to return to ambient. The mean temperature elevations ranged from a low of 2.97 0C (2000 pm) to a high of 7.77 °C (1000 μm). ANOVA and Duncan's Multiple Range Test indicated significant differences in temperature rise by porcelain thickness. It would appear from the results of this research that temperature elevations adjacent to lased porcelain may be sufficiently controllable that safe intraoral porcelain lasing will be possible.

Paper Details

Date Published: 1 June 1990
PDF: 5 pages
Proc. SPIE 1200, Laser Surgery: Advanced Characterization, Therapeutics, and Systems II, (1 June 1990); doi: 10.1117/12.17483
Show Author Affiliations
Joseph R. Barron, Dalhousie Univ. (United States)
Kenneth L. Zakariasen, Dalhousie Univ. (United States)
Larry Peacocke, Dalhousie Univ. (Canada)

Published in SPIE Proceedings Vol. 1200:
Laser Surgery: Advanced Characterization, Therapeutics, and Systems II
Stephen N. Joffe; Kazuhiko Atsumi, Editor(s)

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