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Proceedings Paper

Design of field electron emission spectrometer, field ion microscope, and field electron emission microscope combination
Author(s): S. N. Ivanov; S. N. Shilimanov; Sergei I. Shkuratov
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Paper Abstract

A new set up is described which allows one to carry out field electron microscopic and spectroscopic study of cathode surfaces in direct correlation with their atomic structure.

Paper Details

Date Published: 1 May 1994
PDF: 2 pages
Proc. SPIE 2259, XVI International Symposium on Discharges and Electrical Insulation in Vacuum, (1 May 1994); doi: 10.1117/12.174564
Show Author Affiliations
S. N. Ivanov, Institute of Electrophysics (Russia)
S. N. Shilimanov, Institute of Electrophysics (Russia)
Sergei I. Shkuratov, Institute of Electrophysics (Russia)


Published in SPIE Proceedings Vol. 2259:
XVI International Symposium on Discharges and Electrical Insulation in Vacuum
Gennady A. Mesyats, Editor(s)

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