Share Email Print
cover

Proceedings Paper

Analysis on link failures in free-space optical interconnects
Author(s): Huoy-Yu Liou; Ting-Ting Lin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Free space optical interconnect has provided a promising solution to the effective signal links of the increasing density and complexity in very-large-scale/large-scale integrated circuits. It is getting less affordable if such a system fails just for one tiny physical defect. Our analysis on the potential optical-electrical link failure provides guidelines for future testing and reliable system design. The study of fault models starts by exploring the underlying physical malfunctioning of the opto-electrical components, and their impacts on the assembled systems. We map the physical defects of opto-electronic devices into their corresponding logic-level representation for higher level design consideration. This mapping is chosen for its compatibility and practicability with digital electronic system designs where automated design tools can expedite the design optimization and verification process.

Paper Details

Date Published: 2 May 1994
PDF: 9 pages
Proc. SPIE 2153, Optoelectronic Interconnects II, (2 May 1994); doi: 10.1117/12.174531
Show Author Affiliations
Huoy-Yu Liou, Univ. of California/San Diego (United States)
Ting-Ting Lin, Univ. of California/San Diego (United States)


Published in SPIE Proceedings Vol. 2153:
Optoelectronic Interconnects II
Ray T. Chen; John A. Neff, Editor(s)

© SPIE. Terms of Use
Back to Top