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Proceedings Paper

Misalignment sensitivity analysis of planar optical interconnect systems
Author(s): David E. Zaleta; Susant K. Patra; Jian Ma; Sing H. Lee
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Paper Abstract

In order to fabricate practical free-space optical interconnect systems, a thorough understanding of the effect of optical misalignment on the power throughput of an optical link is required. Further, not only assembly tolerances (resulting in misalignment) but also component manufacturing tolerances that also introduce vignetting into the optical system need to be studied. We present a study of a wide variety of assembly and component manufacturing errors and their effect on the integrated power falling onto the detector for planar space variant optical systems. We also discuss the trends of the different misalignment sensitivities as the interconnect distance increases.

Paper Details

Date Published: 2 May 1994
PDF: 14 pages
Proc. SPIE 2153, Optoelectronic Interconnects II, (2 May 1994); doi: 10.1117/12.174528
Show Author Affiliations
David E. Zaleta, Univ. of California/San Diego (United States)
Susant K. Patra, Univ. of California/San Diego (United States)
Jian Ma, Univ. of California/San Diego (United States)
Sing H. Lee, Univ. of California/San Diego (United States)


Published in SPIE Proceedings Vol. 2153:
Optoelectronic Interconnects II
Ray T. Chen; John A. Neff, Editor(s)

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