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Proceedings Paper

Effects on IC quality of 5X reticle repair using FIB with stain reduction
Author(s): Philip D. Prewett; Brian Martin; John G. Watson; Rik M. Jonckheere
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Paper Abstract

Focused ion beam repair of opaque defects in 5X reticles produces post repair stains which result in ghost defects in wafer prints produced at G-line, I-line, and DUV wavelengths. These stains can be removed using a post repair plasma process which restores transmission to almost 100%. However, a new in situ process is preferred which reduces stains to acceptable levels. The key to the new process is an understanding of factors affecting sputter yield. The effectiveness of the in situ antistain procedure is demonstrated through wafer lithography at all three wavelengths showing an absence of ghost defects following repair.

Paper Details

Date Published: 1 May 1994
PDF: 8 pages
Proc. SPIE 2196, Integrated Circuit Metrology, Inspection, and Process Control VIII, (1 May 1994); doi: 10.1117/12.174127
Show Author Affiliations
Philip D. Prewett, Rutherford Appleton Lab. (United Kingdom)
Brian Martin, GEC Plessey Semiconductors Ltd. (United Kingdom)
John G. Watson, Rutherford Appleton Lab. (United Kingdom)
Rik M. Jonckheere, IMEC (Belgium)


Published in SPIE Proceedings Vol. 2196:
Integrated Circuit Metrology, Inspection, and Process Control VIII
Marylyn Hoy Bennett, Editor(s)

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