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Proceedings Paper

Femtosecond switching of the solid state phase transition in the smart-system material VO2
Author(s): Michael F. Becker; A. Bruce Buckman; Rodger M. Walser; Thierry Lepine; Patrick M. Georges; Alain Brun
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Paper Abstract

We have measured the optical response speed of the semiconductor to metal phase transition in VO2 films for excitation with femtosecond laser pulses at 780 nm wavelength. By probing at a wavelength of 780 nm on a time scale from 0 to 0.5 ns and at 633 nm for longer times, we have determined the dynamic response of the complex refractive index and the complex permittivity as determined from transmission and reflection measurements. The phase transition was found to be largely prompt with the final high-temperature metallic state reached in less than 5 ps.

Paper Details

Date Published: 1 May 1994
PDF: 9 pages
Proc. SPIE 2189, Smart Structures and Materials 1994: Smart Materials, (1 May 1994); doi: 10.1117/12.174076
Show Author Affiliations
Michael F. Becker, Univ. of Texas/Austin (United States)
A. Bruce Buckman, Univ. of Texas/Austin (United States)
Rodger M. Walser, Univ. of Texas/Austin (United States)
Thierry Lepine, Univ. Paris-Sud (France)
Patrick M. Georges, Univ. Paris-Sud (France)
Alain Brun, Univ. Paris-Sud (France)

Published in SPIE Proceedings Vol. 2189:
Smart Structures and Materials 1994: Smart Materials
Vijay K. Varadan, Editor(s)

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