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Proceedings Paper

In-line fiber etalon (ILFE) for internal strain measurement
Author(s): James S. Sirkis; Martin A. Putnam; Timothy A. Berkoff; Alan D. Kersey; E. Joseph Friebele; Richard T. Jones; Denise Brennan
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Paper Abstract

This paper describes an optical fiber interferometer that uses a short segment of silica hollow- core fiber spliced between two sections of single-mode fiber to form a mechanically robust in- line optical cavity. The hollow-core fiber is specifically manufactured to have an outer diameter that is equal to the outer diameter of the single mode lead fibers, thereby combining the best qualities of existing intrinsic and extrinsic Fabry-Perot sensors. Uniaxial tension and pure bending strength tests are used to show that the new configuration does not diminish the axial strength of bare fiber and reduces the bending strength by 17% at most. Similar tests confirm that the fiber sensor has 1.96% strain to failure. Axisymmetric finite element analysis is used to investigate the reliability of the in-line etalon during typical thermoset composite cure conditions, and parametric studies are performed to determine the mechanically optimal cavity length. The sensor strain response tests demonstrate a dynamic strain resolution of 21 n(epsilon) /(root)Hz at frequencies > 5 Hz with a sensor gauge length of 137 micrometers .

Paper Details

Date Published: 1 May 1994
PDF: 11 pages
Proc. SPIE 2191, Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation, (1 May 1994); doi: 10.1117/12.173940
Show Author Affiliations
James S. Sirkis, Univ. of Maryland/College Park (United States)
Martin A. Putnam, Virginia Polytechnic Institute and State Univ. (United States)
Timothy A. Berkoff, SFA, Inc. (United States)
Alan D. Kersey, Naval Research Lab. (United States)
E. Joseph Friebele, Naval Research Lab. (United States)
Richard T. Jones, Univ. of Maryland/College Park (United States)
Denise Brennan, Univ. of Maryland/College Park (United States)


Published in SPIE Proceedings Vol. 2191:
Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation
James S. Sirkis, Editor(s)

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