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Proceedings Paper

Application of the Sagnac interferometer-based strain sensor to an earth movement detection system
Author(s): Eric Udd; Ronald G. Blom; David M. Tralli; Elric W. Saaski; Roy Dokka
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Paper Abstract

A Sagnac interferometric based strain sensor has the potential to measure strain of less than 100 microns over distances of 10 km or more. By incorporating these strain sensors into telecommunication grade fiber otic cable it would be possible to monitor earth movement to high accuracy over very long links at low cost on a continual basis. This technique would be extremely complementary to systems based on the Global Positioning Satellite and Satellite based radar imaging. The potential exists for incorporating the system directly into the local, regional, and national fiber optic telecommunication infrastructure, which would for the first time allow widespread data on earth movement to be obtained. This information would be useful in studying precursory deformation related to earthquake and volcanic activity, landslides, movement of land due to river outflows, and other earth movement features that directly impact the environment. This system could be used to reduce risks in hazardous waste site areas, to monitor strain o power and telecommunication lines, to monitor potential damage due to earth movement of utilities and buildings, and the movement of oil platforms at sea due to river outflows reducing oil spillage risks.

Paper Details

Date Published: 1 May 1994
PDF: 11 pages
Proc. SPIE 2191, Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation, (1 May 1994); doi: 10.1117/12.173939
Show Author Affiliations
Eric Udd, Blue Road Research, Inc. (United States)
Ronald G. Blom, Jet Propulsion Lab. (United States)
David M. Tralli, Jet Propulsion Lab. (United States)
Elric W. Saaski, Research International (United States)
Roy Dokka, Louisiana State Univ. (United States)


Published in SPIE Proceedings Vol. 2191:
Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation
James S. Sirkis, Editor(s)

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