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Proceedings Paper

Radiation tolerant CID imager
Author(s): Jeffrey J. Zarnowski; Joseph Carbone; Richard Carta; Matthew A. Pace
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Paper Abstract

A new European-format CID imager with improved radiation tolerance was developed to meet the operational requirements of the burgeoning international nuclear power generation and waste management markets. Incorporating an inherently radiation tolerant CID architecture fabricated using a new improved radiation resistant process, the imager is designed to survive total dose radiation of more than 106 rads (gamma-Sl) in environments greater than 105 rads/hr (gamma-Sl). The imager format is 786 pixels/row by 612 rows mapped into an 11 MM diagonal optical format. The device incorporates an 11.5 micron2 pixel structure that can be read out either in an interlaced CCIR TV compatible or progressive 25 Hz mode. Additionally, the imager incorporates a deep depletion high resistivity structure that makes it suitable for sensing x ray, nuclear as well as E-beam forms of radiation. The CID device design and tooling was completed during 1993. Sample devices were fabricated and tested during late 1993 and early 1994. Preliminary test results together with further imager and camera development plans are included herein.

Paper Details

Date Published: 1 May 1994
PDF: 12 pages
Proc. SPIE 2172, Charge-Coupled Devices and Solid State Optical Sensors IV, (1 May 1994); doi: 10.1117/12.172762
Show Author Affiliations
Jeffrey J. Zarnowski, CID Technologies Inc. (United States)
Joseph Carbone, CID Technologies Inc. (United States)
Richard Carta, CID Technologies Inc. (United States)
Matthew A. Pace, CID Technologies Inc. (United States)


Published in SPIE Proceedings Vol. 2172:
Charge-Coupled Devices and Solid State Optical Sensors IV
Morley M. Blouke, Editor(s)

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