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Proceedings Paper

Evaluation of a charge injection device array
Author(s): Zoran Ninkov; Chen Tang; Roger L. Easton
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Paper Abstract

A Charge Injection Device Technologies 512 X 512 CID array has been tested at liquid nitrogen temperature to assess its suitability for use in low light applications. The CID-38 chip used was installed in a SICam dewar/electronics from CIDTEC. For this particular system the noise floor was measured to be approximately equals 260 electrons rms for a single readout. Using the nondestructive readout option an approximately equals (root)N, where N is the number of readouts, improvement in this noise figure can be achieved. The average dark current at 77 degree(s)K was not measurable in a three-hour dark integration.

Paper Details

Date Published: 1 May 1994
PDF: 7 pages
Proc. SPIE 2172, Charge-Coupled Devices and Solid State Optical Sensors IV, (1 May 1994); doi: 10.1117/12.172761
Show Author Affiliations
Zoran Ninkov, Rochester Institute of Technology (United States)
Chen Tang, Rochester Institute of Technology (United States)
Roger L. Easton, Rochester Institute of Technology (United States)


Published in SPIE Proceedings Vol. 2172:
Charge-Coupled Devices and Solid State Optical Sensors IV
Morley M. Blouke, Editor(s)

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