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Proceedings Paper

Reliability consideration for AlGaInP laser diodes by automatic power control aging simulation
Author(s): Kentaro Tada; Hitoshi Hotta; Kunihiro Hara; Fumito Miyasaka; Kenichi Kobayashi; Kenji Endo
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Paper Abstract

We develop an automatic power control aging simulation method for AlGaInP visible light emission laser diodes and apply it to aging tests of 650 nm wavelength AlGaInP lasers. A laser degradation expression, on which the simulation is based, is derived from automatic current control tests for 680 nm lasers. The simulation results agree well with the experimental results. The simulation is then used to show laser reliability (operation lifetime) as a function of laser initial characteristics (threshold current, characteristic temperature and the maximum cw temperature).

Paper Details

Date Published: 1 June 1994
PDF: 7 pages
Proc. SPIE 2115, Visible and UV Lasers, (1 June 1994); doi: 10.1117/12.172747
Show Author Affiliations
Kentaro Tada, NEC Corp. (Japan)
Hitoshi Hotta, NEC Corp. (Japan)
Kunihiro Hara, NEC Corp. (Japan)
Fumito Miyasaka, NEC Corp. (Japan)
Kenichi Kobayashi, NEC Corp. (Japan)
Kenji Endo, NEC Corp. (Japan)

Published in SPIE Proceedings Vol. 2115:
Visible and UV Lasers
Richard Scheps, Editor(s)

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