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Proceedings Paper

Design issues for substrate-mode holograms used in optical interconnects
Author(s): James Jang-Hun Yeh; Raymond K. Kostuk
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Paper Abstract

In this paper we discuss a number of issues which affect the performance tolerances of substrate mode holograms (SMHs) used for optical interconnect systems. We examine the effects of emulsion uniformity, thickness variation, and index variation on the ability to accurately determine the diffraction angle within the substrate. The experimental results for the environment stability of SMHs are presented. The effects of emulsion thickness change and cross-coupling on the diffraction efficiency of a 1 X 2 multiplexed SMH are also described.

Paper Details

Date Published: 1 May 1994
PDF: 11 pages
Proc. SPIE 2176, Practical Holography VIII, (1 May 1994); doi: 10.1117/12.172635
Show Author Affiliations
James Jang-Hun Yeh, Univ. of Arizona (United States)
Raymond K. Kostuk, Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 2176:
Practical Holography VIII
Stephen A. Benton, Editor(s)

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