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Proceedings Paper

Displacement and shape information using electronic speckle contouring
Author(s): Ramon Rodriguez-Vera; David Kerr
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Paper Abstract

Electronic Speckle Contouring (ESC) is a recently established technique for shape measurement. This technique is based in a modification of a in-plane and out-of-plane Electronic Speckle Pattern Interferometers (ESPI). It is capable of contour generation by translating the reference and object source illumination. The novel translating the reference and object source illumination. The novel contour fringe interpretation introduced by ESC, facilities their analysis. The ability of this system to determine shape has been demonstrated previously. Now the same system is employed for displacement and shape measuring without hardware modifications of an out-of-plane sensitive layout. Shape and displacement information obtained from a cylindrical surface under a load are combined for obtaining a full deformation field on the surface. The experimental result is shown as a 3D plot obtained from a phase map. Measure range and decorrelation effects are analyzed in order to give more information towards the design and construction of an ESC system.

Paper Details

Date Published: 1 March 1994
PDF: 11 pages
Proc. SPIE 2004, Interferometry VI: Applications, (1 March 1994); doi: 10.1117/12.172616
Show Author Affiliations
Ramon Rodriguez-Vera, Ctr. de Investigaciones en Optica (Mexico)
David Kerr, Loughborough Univ. of Technology (United Kingdom)

Published in SPIE Proceedings Vol. 2004:
Interferometry VI: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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