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Proceedings Paper

Wavefront dislocations and phase image formation inside diffraction spot
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Paper Abstract

The question of informative character of special image points--wavefront dislocations, is discussed. They were observed in real phase images of microstructures, which had comparable and smaller linear dimensions than diffraction limit. According to the existing classification, phase patterns of the main types of wavefront dislocations were identified. Their influence on the phase imaging formation is investigated. The case of induced phase contrast due to considerable decrease, but not quite vanishing of the complex amplitude, is taken into consideration. The contour making and contrasting tendency in the presence of the combination of dislocations, is demonstrated. Observation of anomal small-size details in phase and polarization images and the possibility of their observation in general `functional' image, is discussed. The experimental pictures were obtained with the help of unique phase microscope `AiryScan' technique.

Paper Details

Date Published: 1 March 1994
PDF: 10 pages
Proc. SPIE 2004, Interferometry VI: Applications, (1 March 1994); doi: 10.1117/12.172614
Show Author Affiliations
Alexander V. Tavrov, International Society for Machinebuilders (Germany)
Vladimir P. Tychinsky, Moscow Institute for Radioengineering, Electronics, and Automation (Russia)

Published in SPIE Proceedings Vol. 2004:
Interferometry VI: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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