Share Email Print
cover

Proceedings Paper

Infrared tunable diode laser diagnostics for aircraft exhaust emissions characterization
Author(s): Joda C. Wormhoudt; Mark S. Zahniser; David D. Nelson; J. Barry McManus; R. C. Miake-Lye; Charles E. Kolb
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The atmospheric effects of stratospheric aircraft component of the NASA High Speed Research Program will require measurements of trace gas concentrations in the exhausts of high speed civil transport engines. In parallel with the development of these engines by NASA and its industrial partners, a portable infrared tunable diode laser apparatus has been assembled and tested which is capable of both in situ and extractive sampling of combustion gas flows. Infrared diode laser absorption is sensitive, quantitative, and applicable to a wide range of molecular species. In the present apparatus, sensitive detection is achieved by rapid frequency scanning and real-time nonlinear least squares fitting and background subtraction. Sensitivity is further increased for extractive sampling by an advanced design multiple pass cell which gives longer path lengths in smaller volumes. Observations of a laboratory flat flame burner are reported. These observations and spectroscopic models are used to predict detection sensitivities in exhausts and other combustion systems.

Paper Details

Date Published: 18 March 1994
PDF: 12 pages
Proc. SPIE 2122, Laser Applications in Combustion and Combustion Diagnostics II, (18 March 1994); doi: 10.1117/12.171299
Show Author Affiliations
Joda C. Wormhoudt, Aerodyne Research, Inc. (United States)
Mark S. Zahniser, Aerodyne Research, Inc. (United States)
David D. Nelson, Aerodyne Research, Inc. (United States)
J. Barry McManus, Aerodyne Research, Inc. (United States)
R. C. Miake-Lye, Aerodyne Research, Inc. (United States)
Charles E. Kolb, Aerodyne Research, Inc. (United States)


Published in SPIE Proceedings Vol. 2122:
Laser Applications in Combustion and Combustion Diagnostics II
Randy J. Locke, Editor(s)

© SPIE. Terms of Use
Back to Top