Share Email Print
cover

Proceedings Paper

Image processing system to autoanalyze particle distributions for in-line particle holograms
Author(s): Lei-Jian Liu; Xiao-Jun Shen; Jingyu Yang; Ke Liu; Qing Hu; Yong-Ge Wu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Being the preliminary task of holographic image processing, various approaches for the holographic image analysis have been proposed. This presentation describes an on—line image processing system for the automatic distribution analysis of particles in particle holograms. In this system, the particle holograms are obtained using in—line retrieval method. To find the approximate locations of particles, or seed points, the holographic images are first processed by the Sobel operator, and automatically thresholded. Then, using the seeds and a bi—threshold region growing technique, the edges and the preliminary parameters of the candidate particles are obtained by edge tracking in the original images. To remove the speckle noises caused by in—line retrieval method, the variance of the radius of the candidates and the texture of the candidate areas in the Sobeled images are analyzed. After that, the radial intensity profile of the candidates and the clearness of candidate neighboring areas in the original images are analyzed to remove particles out—of—focus. At last, the candidates are verified, and the statistical data of the verified particles are calculated. Experiment results are given to show the efficiency of the approach described in this presentation. Key Words: Particle Hologram, In—Line Retrieval Method, Segmentation, Region Growing.

Paper Details

Date Published: 18 March 1994
PDF: 14 pages
Proc. SPIE 2122, Laser Applications in Combustion and Combustion Diagnostics II, (18 March 1994); doi: 10.1117/12.171294
Show Author Affiliations
Lei-Jian Liu, Nanjing Univ. of Science & Technology (China)
Xiao-Jun Shen, Univ. of Missouri/Kansas City (United States)
Jingyu Yang, Nanjing Univ. of Science & Technology (China)
Ke Liu, Nanjing Univ. of Science & Technology (China)
Qing Hu, Univ. of Missouri/Kansas City (United States)
Yong-Ge Wu, Nanjing Univ. of Science & Technology (China)


Published in SPIE Proceedings Vol. 2122:
Laser Applications in Combustion and Combustion Diagnostics II
Randy J. Locke, Editor(s)

© SPIE. Terms of Use
Back to Top