Share Email Print
cover

Proceedings Paper

Real and imaginary index-of-refraction measurements for RP-1 rocket fuel
Author(s): Dennis R. Alexander; Robert D. Kubik; Ramu Kalwala; John P. Barton
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Complex index of refraction values of RP-1 liquid rocket fuel are reported at laser wavelengths of 0.193 micrometers (ArF excimer), 0.5145 micrometers (argon-ion), 0.532 micrometers (Nd-YAG, frequency doubled), 1.064 micrometers (Nd-YAG), and 10.5915 micrometers (CO2). The imaginary part of the index of refraction (k) was determined by the traditional transmission method. The real part (n-r)) is determined by reflectance measurements, critical angle, Mueller matrix, and Michelson interferometer techniques. Reflectance measurements are used to obtain nr at a wavelength of 0.193 micrometers . Critical angle method is used to determine nr at 0.5145 micrometers and 0.532 micrometers . The real part of the refractive index is obtained from Snell's law by measuring the critical angle. The real part of the refractive index at 1.064 micrometers is derived based on elements of the Mueller matrix. Specular measurements were performed using a TMA scatterometer to obtain the Mueller matrix. A Michelson interferometer is used to determine nr at 10.5915 micrometers .

Paper Details

Date Published: 18 March 1994
PDF: 13 pages
Proc. SPIE 2122, Laser Applications in Combustion and Combustion Diagnostics II, (18 March 1994); doi: 10.1117/12.171288
Show Author Affiliations
Dennis R. Alexander, Univ. of Nebraska/Lincoln (United States)
Robert D. Kubik, Univ. of Nebraska/Lincoln (United States)
Ramu Kalwala, Univ. of Nebraska/Lincoln (United States)
John P. Barton, Univ. of Nebraska/Lincoln (United States)


Published in SPIE Proceedings Vol. 2122:
Laser Applications in Combustion and Combustion Diagnostics II
Randy J. Locke, Editor(s)

© SPIE. Terms of Use
Back to Top