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Proceedings Paper

Analysis of a proposed Compton backscatter imaging technique
Author(s): James M. Hall; Barry Alan Jacoby
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Paper Abstract

One-sided imaging techniques are currently being used in nondestructive evaluation of surfaces and shallow subsurface structures. In this work we present both analytical calculations and detailed Monte Carlo simulations aimed at assessing the capability of a proposed Compton backscattering imaging technique designed to detect and characterize voids located several centimeters below the surface of a solid.

Paper Details

Date Published: 28 March 1994
PDF: 12 pages
Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); doi: 10.1117/12.171264
Show Author Affiliations
James M. Hall, Lawrence Livermore National Lab. (United States)
Barry Alan Jacoby, Lawrence Livermore National Lab. (United States)

Published in SPIE Proceedings Vol. 2092:
Substance Detection Systems
Geoffrey L. Harding; Richard C. Lanza; Lawrence J. Myers; Peter A. Young, Editor(s)

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