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Proceedings Paper

X-ray scattering signatures for material identification
Author(s): Robert D. Speller; Julie A. Horrocks; Richard John Lacey
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Paper Abstract

X-ray scattering at low angles demonstrates diffraction effects that can be used to characterize materials. The effects of overlying material are shown not to affect the usefulness of the data for the identification of explosives. The important features in the scattering signature are identified.

Paper Details

Date Published: 28 March 1994
PDF: 12 pages
Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); doi: 10.1117/12.171256
Show Author Affiliations
Robert D. Speller, Univ. College London (United Kingdom)
Julie A. Horrocks, St. Bartholomew's Hospital (United Kingdom)
Richard John Lacey, Police Science Development Branch (United Kingdom)

Published in SPIE Proceedings Vol. 2092:
Substance Detection Systems
Geoffrey L. Harding; Richard C. Lanza; Lawrence J. Myers; Peter A. Young, Editor(s)

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