Share Email Print
cover

Proceedings Paper

Diffraction pattern analysis for automatic defect classification in manufactured electronic assemblies
Author(s): David J. Search; Clifford Allan Hobson; John T. Atkinson; Jeremy David Pearson
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A technique for the quality assessment of fine-pitch electronic components is described. A system for the capture of Fraunhofer diffraction patterns reflected from the component is presented. The processing of the image to enable classification by a neural network is discussed. Simulation results are presented, showing the feasibility of the technique.

Paper Details

Date Published: 11 March 1994
PDF: 10 pages
Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); doi: 10.1117/12.171222
Show Author Affiliations
David J. Search, Liverpool John Moores Univ. (United Kingdom)
Clifford Allan Hobson, Liverpool John Moores Univ. (United Kingdom)
John T. Atkinson, Liverpool John Moores Univ. (United Kingdom)
Jeremy David Pearson, Liverpool John Moores Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 2183:
Machine Vision Applications in Industrial Inspection II
Benjamin M. Dawson; Stephen S. Wilson; Frederick Y. Wu, Editor(s)

© SPIE. Terms of Use
Back to Top