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Proceedings Paper

Advanced pattern inspection using Macroview
Author(s): Moritoshi Ando; Hideo Okada; Yoshikazu Kakinoki
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Paper Abstract

The new pattern inspection algorithm we developed detects fatal defects on printed wiring boards. The algorithm determines whether patterns identified by an automated pattern inspection (AOI) system are actually defective by considering the electrical malfunction that the defect will cause. A macroscopic model based on the pattern design rules and their tolerances to pattern violations is needed to evaluate defects. The algorithm classifies features around a defective pattern into 50 categories and compares the defect distribution with preset check rules. The automated optical verification system we developed captures pattern images with a CCD camera and uses verification software to evaluate defects. The process takes 10 seconds per image. We tested the system on the factory floor, and it detected all defects with less than 4.8 percent of false alarms.

Paper Details

Date Published: 11 March 1994
PDF: 8 pages
Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); doi: 10.1117/12.171203
Show Author Affiliations
Moritoshi Ando, Fujitsu Labs. Ltd. (Japan)
Hideo Okada, Fujitsu Labs. Ltd. (Japan)
Yoshikazu Kakinoki, Fujitsu Labs. Ltd. (Japan)


Published in SPIE Proceedings Vol. 2183:
Machine Vision Applications in Industrial Inspection II
Benjamin M. Dawson; Stephen S. Wilson; Frederick Y. Wu, Editor(s)

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