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Proceedings Paper

Development of emissivity models and induced transmission filters for multiwavelength imaging pyrometry
Author(s): Nuggehalli M. Ravindra; Fei Ming Tong; Samiul Amin; J. Shah; Walter F. Kosonocky; Nathaniel J. McCaffrey; Constantine N. Manikopoulos; Bawa Singh; Ramazan Soydan; Lawrence K. White; Pete Zanzucchi; Dorothy Hoffman; James R. Markham; Shaohua Liu; Karen Kinsella; Richard T. Lareau; L. M. Casas; T. Monahan; D. W. Eckart
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Paper Abstract

The results of our work on the development of emissivity models and IR filters for applications in multi-wavelength imaging pyrometry are presented. Techniques such as Fourier transform IR spectroscopy have been deployed to determine the emissivity of Si and SiO2/Si in the temperature range of 331 to 1235 K. These measurements have been obtained for n-Si, p-Si and SiO2/Si in the oxide thickness range of 60 to 500 nm. These results coupled with calculations of emissivity from first principles lead us to model the wavelength dependence of emissivity. Preliminary measurements of emissivity of HgCdTe are reported.

Paper Details

Date Published: 21 March 1994
PDF: 15 pages
Proc. SPIE 2245, Thermosense XVI: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (21 March 1994); doi: 10.1117/12.171183
Show Author Affiliations
Nuggehalli M. Ravindra, New Jersey Institute of Technology (United States)
Fei Ming Tong, New Jersey Institute of Technology (United States)
Samiul Amin, New Jersey Institute of Technology (United States)
J. Shah, New Jersey Institute of Technology (United States)
Walter F. Kosonocky, New Jersey Institute of Technology (United States)
Nathaniel J. McCaffrey, New Jersey Institute of Technology (United States)
Constantine N. Manikopoulos, New Jersey Institute of Technology (United States)
Bawa Singh, David Sarnoff Research Ctr. (United States)
Ramazan Soydan, David Sarnoff Research Ctr. (United States)
Lawrence K. White, David Sarnoff Research Ctr. (United States)
Pete Zanzucchi, David Sarnoff Research Ctr. (United States)
Dorothy Hoffman, David Sarnoff Research Ctr. (United States)
James R. Markham, Advanced Fuel Research, Inc. (United States)
Shaohua Liu, Advanced Fuel Research, Inc. (United States)
Karen Kinsella, Advanced Fuel Research, Inc. (United States)
Richard T. Lareau, Army Research Lab. (United States)
L. M. Casas, Army Research Lab. (United States)
T. Monahan, Army Research Lab. (United States)
D. W. Eckart, Army Research Lab. (United States)


Published in SPIE Proceedings Vol. 2245:
Thermosense XVI: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
John R. Snell, Editor(s)

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