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Proceedings Paper

Thick volume photorefractive crystal wavelength-multiplexed reflection-type matched filter
Author(s): Francis T. S. Yu; Shizhuo Yin; Z. H. Yang
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Paper Abstract

In this paper, application of thick photorefractive (PR) crystal to wavelength-multiplexed reflection-type matched filter is described. The Bragg diffraction limitation and the shift- invariant property using thick volume PR crystal are discussed, in which we see that the Bragg diffraction is severely limited by the thickness of the crystal. To alleviate the Bragg limitation in terms of shift tolerance, we have shown that the reflection-type wavelength-multiplexed PR filter can be used. Experimental confirmation of these findings are also provided.

Paper Details

Date Published: 1 March 1994
PDF: 12 pages
Proc. SPIE 2237, Optical Pattern Recognition V, (1 March 1994); doi: 10.1117/12.169443
Show Author Affiliations
Francis T. S. Yu, The Pennsylvania State Univ. (United States)
Shizhuo Yin, The Pennsylvania State Univ. (United States)
Z. H. Yang, The Pennsylvania State Univ. (United States)


Published in SPIE Proceedings Vol. 2237:
Optical Pattern Recognition V
David P. Casasent; Tien-Hsin Chao, Editor(s)

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