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Proceedings Paper

Automatic in-line optical defect inspection system for aperture grilles
Author(s): Andrew Chiu; Daniel Orband
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Paper Abstract

This paper presents an automatic in-line optical defect inspection systems for aperture grilles used for Sony Trinitron related products. The requirement to detect defects as small as 50 micrometers X 150 micrometers in as large as 1000 mm X 800 mm aperture grilles imposes a severe limitation for conventional machine vision techniques.

Paper Details

Date Published: 1 March 1994
PDF: 8 pages
Proc. SPIE 2237, Optical Pattern Recognition V, (1 March 1994); doi: 10.1117/12.169429
Show Author Affiliations
Andrew Chiu, Sony Electronics Inc. (United States)
Daniel Orband, Optomation, Inc. (United States)

Published in SPIE Proceedings Vol. 2237:
Optical Pattern Recognition V
David P. Casasent; Tien-Hsin Chao, Editor(s)

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