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Proceedings Paper

Machine vision detection of the high points on small, curved, shiny things
Author(s): Nabil I. Hachem; Michael A. Gennert; Norman Wittels
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Paper Abstract

In this paper we discuss how to design a practical height gauging system based on the structured lighting approaches described. We show how some of the system limitations caused by the illumination and observation geometry affect component specifications. Examples of a machine vision inspection applications designed using these design principles is presented and analyzed. Finally, we discuss methods to extend this method.

Paper Details

Date Published: 15 March 1994
PDF: 10 pages
Proc. SPIE 2065, Optics, Illumination, and Image Sensing for Machine Vision VIII, (15 March 1994); doi: 10.1117/12.169377
Show Author Affiliations
Nabil I. Hachem, Worcester Polytechnic Institute (United States)
Michael A. Gennert, Worcester Polytechnic Institute (United States)
Norman Wittels, Worcester Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 2065:
Optics, Illumination, and Image Sensing for Machine Vision VIII
Donald J. Svetkoff, Editor(s)

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