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Proceedings Paper

Reliability assessment of 1480/1550 nm filter-based WDM for optical amplifier applications
Author(s): Gary Duck; Brian Kawasaki
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Paper Abstract

The requirements for reliability of optical devices are becoming increasingly stringent. The qualification of new products requires that a variety of tests be performed under a range of severe environmental stress conditions. Results of test programs on an interference filter-based WDM for use in 1480 nm pumped erbium doped optical fiber amplifiers demonstrate that these components can meet existing requirements. With test specifications now requiring test durations of 5000 hours, automated test systems are necessary.

Paper Details

Date Published: 1 March 1994
PDF: 5 pages
Proc. SPIE 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments, (1 March 1994); doi: 10.1117/12.168625
Show Author Affiliations
Gary Duck, JDS Fitel Inc. (Canada)
Brian Kawasaki, JDS Fitel Inc. (Canada)

Published in SPIE Proceedings Vol. 2074:
Fiber Optics Reliability and Testing: Benign and Adverse Environments
Dilip K. Paul; Hakan H. Yuce, Editor(s)

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