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Proceedings Paper

Polymer/silica optical fiber interfaces studied by atomic force microscopy
Author(s): Qian Zhong; Daryl Inniss
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Paper Abstract

An atomic force microscope (AFM), operated in both contact and tapping mode, was used to study fractured polymer/silica optical fiber interfaces. The polymer coating was separated from the fiber either by pulling the fiber out of the coating or via delamination through immersing the coated fiber in an organic solvent. The fracture surfaces were analyzed by comparing the resultant surface topography with the polymer removal procedures. The AFM analyses suggest that the fracture process is sensitive to the cohesive properties of the polymer, as well as the adhesive bond strength of the interface. We demonstrate the utility of an AFM to study adhesion of viscoelastic polymers to silica surfaces.

Paper Details

Date Published: 1 March 1994
PDF: 8 pages
Proc. SPIE 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments, (1 March 1994); doi: 10.1117/12.168622
Show Author Affiliations
Qian Zhong, AT&T Bell Labs. (United States)
Daryl Inniss, AT&T Bell Labs. (United States)

Published in SPIE Proceedings Vol. 2074:
Fiber Optics Reliability and Testing: Benign and Adverse Environments
Dilip K. Paul; Hakan H. Yuce, Editor(s)

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