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Proceedings Paper

Defect engineering in doped silica fiber: are there good and bad defects?
Author(s): Jay R. Simpson; Paul F. Wysocki; Matthijs M. Broer; Robert M. Atkins; Paul J. Lemaire
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Paper Abstract

The defect driven properties of erbium doped fiber amplifier devices are reviewed examining the role of the host dopants, aluminum, phosphorus and germanium, typically used in these applications. The effects of added loss on the performance of amplifiers are shown by way of modeling. Measurements of the gamma and UV radiation induced absorption are presented to show the generic host glass composition effects on radiation induced loss and their relative magnitude. In contrast to these `bad' defects, the UV induced effects in H2 impregnated fiber are discussed in their role as `good' defects, allowing the more efficient writing of UV induced gratings.

Paper Details

Date Published: 15 February 1994
PDF: 12 pages
Proc. SPIE 2073, Fiber Laser Sources and Amplifiers V, (15 February 1994); doi: 10.1117/12.168609
Show Author Affiliations
Jay R. Simpson, AT&T Bell Labs. (United States)
Paul F. Wysocki, AT&T Bell Labs. (United States)
Matthijs M. Broer, AT&T Bell Labs. (United States)
Robert M. Atkins, AT&T Bell Labs. (United States)
Paul J. Lemaire, AT&T Bell Labs. (United States)

Published in SPIE Proceedings Vol. 2073:
Fiber Laser Sources and Amplifiers V
Michel J. F. Digonnet, Editor(s)

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