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Proceedings Paper

Polarization characteristics of synchrotron radiation by means of rotating-analyzer ellipsometry using soft x-ray multilayer
Author(s): Hiroaki Kimura; Toyohiko Kinoshita; Shyouzi Suzuki; Tsuneaki Miyahara; Masaki Yamamoto
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Paper Abstract

We have measured the states of polarization of synchrotron radiation at a few beamlines at the Photon Factory using multilayer mirrors as a polarizer or an analyzer. Remarkable differences between the observed data and the theoretical prediction have been found for bending magnet radiation. It has been also found that changes of the states of polarization, especially the inclination of the major axis of the polarization ellipses is caused by the beamline optics both for bending and undulator radiation.

Paper Details

Date Published: 15 February 1994
PDF: 8 pages
Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); doi: 10.1117/12.168588
Show Author Affiliations
Hiroaki Kimura, Graduate Univ. for Advanced Studies (Japan)
Toyohiko Kinoshita, Univ. of Tokyo (Japan)
Shyouzi Suzuki, Tohoku Univ. (Japan)
Tsuneaki Miyahara, National Lab. for High Energy Physics (Japan)
Masaki Yamamoto, Tohoku Univ. (Japan)

Published in SPIE Proceedings Vol. 2010:
X-Ray and Ultraviolet Polarimetry
Silvano Fineschi, Editor(s)

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