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Proceedings Paper

Optical constant determination for x-ray materials
Author(s): Michele M. Wilson; Jongmin Kim; Muamer Zukic; Douglas G. Torr
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Paper Abstract

In the x-ray region of the spectrum, the optical constants of electron beam vacuum evaporated absorbing thin films are determined by measuring the reflectance at a number of angles of incidence. A method for calculating the optical constants through an iteration process of matching calculated and measured values of the reflectance is described.

Paper Details

Date Published: 15 February 1994
PDF: 9 pages
Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); doi: 10.1117/12.168583
Show Author Affiliations
Michele M. Wilson, Univ. of Alabama in Huntsville (United States)
Jongmin Kim, Univ. of Alabama in Huntsville (United States)
Muamer Zukic, Univ. of Alabama in Huntsville (United States)
Douglas G. Torr, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 2010:
X-Ray and Ultraviolet Polarimetry
Silvano Fineschi, Editor(s)

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