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Proceedings Paper

Polarimetry with use of soft x-ray multilayers
Author(s): Masaki Yamamoto
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Paper Abstract

Soft x-ray polarimetry and ellipsometry have been made possible by the development of multilayer polarizers and phase shifters. In addition to the reflection type, a free-standing transmission type was also developed. With the polarizing elements, polarization of synchrotron radiation was measured, which revealed that the long axes of polarization ellipses were not horizontal but inclined. With a transmission phase shifter having 80.7 degree(s) phase shift, all normalized Stokes parameters of a partially polarized radiation from a laser produced plasma source were measured under a laboratory condition.

Paper Details

Date Published: 15 February 1994
PDF: 8 pages
Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); doi: 10.1117/12.168575
Show Author Affiliations
Masaki Yamamoto, Tohoku Univ. (Japan)


Published in SPIE Proceedings Vol. 2010:
X-Ray and Ultraviolet Polarimetry
Silvano Fineschi, Editor(s)

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