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Proceedings Paper

Development of a hard x-ray imaging polarimeter
Author(s): Robert A. Austin; Takahisa Minamitani; Brian D. Ramsey
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Paper Abstract

An optical imaging chamber can be used to detect x-rays by imaging the tracks of photoelectrons ejected when the x-rays are absorbed in the detector volume. These tracks contain information about the location of the x-ray interaction point and its polarization. In the lab, we have obtained a modulation factor of 30% for 60 keV polarized x-rays. Here we discuss preliminary work done towards building a large area hard x-ray imaging polarimeter which will be able to measure x-ray polarizations from bright cosmic x-ray sources at energies between 40 keV and 100 keV.

Paper Details

Date Published: 15 February 1994
PDF: 8 pages
Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); doi: 10.1117/12.168571
Show Author Affiliations
Robert A. Austin, Hughes STX Corp. (United States)
Takahisa Minamitani, Hughes STX Corp. (United States)
Brian D. Ramsey, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 2010:
X-Ray and Ultraviolet Polarimetry
Silvano Fineschi, Editor(s)

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