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Proceedings Paper

Development of an automatic spectrophotometer
Author(s): Peiyun Wu; Peifu Gu; Xu Liu; Jinfa Tang
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Paper Abstract

An automatic spectrophotometer has been developed for spectral measurements of transmittance, reflectance and total optical losses of thin film specimens. The general system design and automation is described. The measured results of narrowband filters, ZnS films, mirrors, etc., are presented. In the visible region, the overall photometric accuracy is verified to be 0.1% and 0.2% for transmittance and reflectance; respectively. The wavelength scale is accurate to within 0.5 nm with a reproducibility of 0.1 nm.

Paper Details

Date Published: 1 February 1994
PDF: 9 pages
Proc. SPIE 1994, Advanced Optical Manufacturing and Testing IV, (1 February 1994); doi: 10.1117/12.168212
Show Author Affiliations
Peiyun Wu, Zhejiang Univ. (China)
Peifu Gu, Zhejiang Univ. (China)
Xu Liu, Zhejiang Univ. (China)
Jinfa Tang, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 1994:
Advanced Optical Manufacturing and Testing IV
Victor J. Doherty, Editor(s)

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