Share Email Print
cover

Proceedings Paper

Trends in instrumentation for roughness and form measurement
Author(s): David J. Whitehouse
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

To control processes capable of accuracy and surface finish requires surface measuring equipment of a very high order of capability and versatility. Metrology has also required a similar change in discipline to include more physical considerations than was considered necessary only a few years ago. In what follows some of the existing trends are reviewed.

Paper Details

Date Published: 1 February 1993
PDF: 16 pages
Proc. SPIE 2088, Laser Dimensional Metrology: Recent Advances for Industrial Application, (1 February 1993); doi: 10.1117/12.168063
Show Author Affiliations
David J. Whitehouse, Univ. of Warwick (United Kingdom)


Published in SPIE Proceedings Vol. 2088:
Laser Dimensional Metrology: Recent Advances for Industrial Application

© SPIE. Terms of Use
Back to Top