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Proceedings Paper

Two- and three-dimensional laser scanners for fast dimensional measurements and inspection
Author(s): Willem D. van Amstel; Ronald J. Asjes; Peter F.A. van de Goor; Piet Merkelbach
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Paper Abstract

A family of high performance industrial laser scanners has been developed at Philips, based on a unique, reflective, field flattening system as an alterative for f-(Theta) scan lenses that are usually applied in laser scanners. This novel scan approach enables pure telecentric and flat field scanning of wide formats at very high resolution and speed. The attractive features of this particular scan concept are demonstrated by two different 2-D industrial inspection problems that have been solved at Philips during the last ten years.

Paper Details

Date Published: 1 February 1993
PDF: 4 pages
Proc. SPIE 2088, Laser Dimensional Metrology: Recent Advances for Industrial Application, (1 February 1993); doi: 10.1117/12.168057
Show Author Affiliations
Willem D. van Amstel, Philips Ctr. for Manufacturing Technology (Netherlands)
Ronald J. Asjes, Philips Ctr. for Manufacturing Technology (Netherlands)
Peter F.A. van de Goor, Philips Ctr. for Manufacturing Technology (Netherlands)
Piet Merkelbach, Philips Ctr. for Manufacturing Technology (Netherlands)


Published in SPIE Proceedings Vol. 2088:
Laser Dimensional Metrology: Recent Advances for Industrial Application
Michael J. Downs, Editor(s)

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