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Proceedings Paper

Phase retardance and optical extinction symmetry measurements for some birefringent materials
Author(s): Michael A. Bukshtab; Gregory J. Mizell
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Paper Abstract

Results of highly sensitive phase retardance and optical extinction symmetry measurements using a precision ellipsometry apparatus are described. Quartz wave plate retardance measurement accuracy was enhanced through the use of three laser wavelengths at 1064, 632.8, and 532 nm. Optical extinction symmetry phenomena in crystal quartz, KNbO3, Nd:YVO4 and TiO2 was also investigated in order to correlate variations in retardance measurements to crystal quality and orientation accuracy.

Paper Details

Date Published: 1 February 1994
PDF: 7 pages
Proc. SPIE 1994, Advanced Optical Manufacturing and Testing IV, (1 February 1994); doi: 10.1117/12.167959
Show Author Affiliations
Michael A. Bukshtab, Virgo Optics (United States)
Gregory J. Mizell, Virgo Optics (United States)


Published in SPIE Proceedings Vol. 1994:
Advanced Optical Manufacturing and Testing IV
Victor J. Doherty, Editor(s)

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