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Proceedings Paper

Stigmatic high-resolution high-throughput narrowband diffraction spectrograph employing multilayer mirrors
Author(s): Eugene N. Ragozin; Nikolai N. Kolachevsky; Mikhail M. Mitropolsky; Anatoli I. Fedorenko; V. V. Kondratenko; S. A. Yulin
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Paper Abstract

A novel diffraction spectroscopic instrument comprising two focusing multilayer mirrors (MMs) at near-normal incidence and a conventional blazed plane grating at grazing incidence has been implemented. A nearly perfect stigmatism and a theoretical resolving power above 6 X 104 are due to the separation of the focusing and dispersing functions. For higher throughput, MMs with nearly identical resonance reflection curves around (lambda) 0 approximately equals 135 angstroms have been synthesized employing a magnetron ion sputtering source. The instrument performance has been assessed using a laser-plasma XUV radiation source. The spectral resolution in excess of 4 X 103 and the applicability to space-resolved spectroscopy and plasma diagnosis have been demonstrated.

Paper Details

Date Published: 1 February 1994
PDF: 12 pages
Proc. SPIE 2012, Ultrashort Wavelength Lasers II, (1 February 1994); doi: 10.1117/12.167388
Show Author Affiliations
Eugene N. Ragozin, P.N. Lebedev Physical Institute (Russia)
Nikolai N. Kolachevsky, P.N. Lebedev Physical Institute (Russia)
Mikhail M. Mitropolsky, P.N. Lebedev Physical Institute (Russia)
Anatoli I. Fedorenko, Khar'kov Polytechnical Institute (Ukraine)
V. V. Kondratenko, Khar'kov Polytechnical Institute (Ukraine)
S. A. Yulin, Khar'kov Polytechnical Institute (Ukraine)


Published in SPIE Proceedings Vol. 2012:
Ultrashort Wavelength Lasers II
Szymon Suckewer, Editor(s)

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