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Proceedings Paper

High-resolution x-ray scatter and reflectivity study of sputtered IR surfaces
Author(s): Finn Erland Christensen; Salim Abdali; Allan Hornstrup; Herbert W. Schnopper; Patrick O. Slane; Suzanne E. Romaine
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Paper Abstract

In recent years there has been an increased interest in the possible use of Ir as the reflecting surface in X-ray telescope programs. An X-ray study of such surfaces produced by sputtering of Ir on highly polished Zerodur flats is presented here. The study was performed using Fe K(alpha) 1 (6.404 Kev) and Cu K(alpha) 1 (8.048 keV) and includes measurement of total external reflection and scattering. The scattering measurement was made with three different instruments arrangements; one employed a 1D position sensitive detector for low resolution studies giving approximately 30 arcsec resolution (FWHM), and the other two arrangements employed channel cut crystals providing resolutions (FWHM) of 5 arcsec and 1 arcsec, respectively at Cu K(alpha) 1. The reflectivity study revealed a very close correspondence with a theoretical model based on recently published optical constants. This important result shows that an Ir coating can be produced with nominal bulk density.

Paper Details

Date Published: 1 February 1994
PDF: 16 pages
Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); doi: 10.1117/12.167242
Show Author Affiliations
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Salim Abdali, Danish Space Research Institute (Denmark)
Allan Hornstrup, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Danish Space Research Institute (Denmark)
Patrick O. Slane, Smithsonian Astrophysical Observatory (United States)
Suzanne E. Romaine, Smithsonian Astrophysical Observatory (United States)


Published in SPIE Proceedings Vol. 2011:
Multilayer and Grazing Incidence X-Ray/EUV Optics II
Richard B. Hoover, Editor(s)

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