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Proceedings Paper

Quantitative measurements of the performance of capillary x-ray optics
Author(s): Carolyn A. MacDonald; Carmen C. Abreu; S. Budkov; Huaiyu Heather Chen; X. Fu; Walter M. Gibson; A. Kardiawarman; Andrei A. Karnaukhov; Vladimir Kovantsev; Igor Yu. Ponomarev; Bimal K. Rath; Johannes B. Ullrich; Michael H. Vartanian; Qi-Fan Xiao
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Paper Abstract

Since the recent invention by Kumakhov of polycapillary optics for the control of x-ray beams, a large number of potential applications have been identified. These include materials analysis techniques such as diffraction and microfluorescence, lithography, medical imaging applications such as angiography and mammography, and medical therapy. To develop and further identify these applications, precise knowledge is needed of the performance of a variety of capillary types for different source energies and geometries. Extensive measurements have been performed of transmission and exit divergence as a function of length, bend radius, x-ray source position, and x-ray energy (from 1 to 44 keV). X-ray source divergence was also varied; measurements were performed with point sources and synchrotron beams. The measurements were performed for a variety of polycapillary compositions, diameters, and geometries. In general, data agrees fairly well with Monte Carlo geometrical simulations.

Paper Details

Date Published: 1 February 1994
PDF: 12 pages
Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); doi: 10.1117/12.167239
Show Author Affiliations
Carolyn A. MacDonald, SUNY/Albany and X-Ray Optical Systems, Inc. (United States)
Carmen C. Abreu, SUNY/Albany (United States)
S. Budkov, X-Ray Optical Systems, Inc. (United States)
Institute for Roentgen Optical Systems (Russia)
Huaiyu Heather Chen, National Institute of Standards and Technology (United States)
X. Fu, SUNY/Albany and X-Ray Optical Systems, Inc. (United States)
Walter M. Gibson, SUNY/Albany (United States)
A. Kardiawarman, SUNY/Albany and X-Ray Optical Systems, Inc. (United States)
Andrei A. Karnaukhov, X-Ray Optical Systems, Inc (United States)
Institute for Roentgen Optical Systems (Russia)
Vladimir Kovantsev, SUNY/Albany and X-Ray Optical Systems, Inc. (United States)
Institute for Roentgen Optical Sys (Russia)
Igor Yu. Ponomarev, X-Ray Optical Systems, Inc. (United States)
Institute for Roentgen Optical Systems (Russia)
Bimal K. Rath, SUNY/Albany (United States)
Johannes B. Ullrich, SUNY/Albany (United States)
Michael H. Vartanian, X-Ray Optical Systems, Inc. (United States)
Qi-Fan Xiao, X-Ray Optical Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 2011:
Multilayer and Grazing Incidence X-Ray/EUV Optics II
Richard B. Hoover, Editor(s)

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