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Proceedings Paper

Measurement of multilayer reflectivities from 8 keV to 130 keV
Author(s): Peter Hoghoj; Karsten Dan Joensen; Finn Erland Christensen; Jean Susini; Eric Ziegler; Andreas K. Freund; E. Lueken; Christian Riekel
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Paper Abstract

This paper presents measurements of specular and non-specular reflectivities of a W/Si multilayer with period d equals 135.1 angstroms. Angular dispersive measurements were performed at 8.05 keV and 59.3 keV, while energy dispersive measurements were made in the range of 17 keV to 130 keV. At an incidence angle of 1.57 mrad the fourth order Bragg- reflection is found at an energy of 125 keV with a reflectivity in excess of 50% and a bandwidth (FWHM) of 3%.

Paper Details

Date Published: 1 February 1994
PDF: 6 pages
Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); doi: 10.1117/12.167237
Show Author Affiliations
Peter Hoghoj, European Synchrotron Radiation Facility (France)
Karsten Dan Joensen, Harvard-Smithsonian Astrophysical Observatory (United States)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Jean Susini, European Synchrotron Radiation Facility (France)
Eric Ziegler, European Synchrotron Radiation Facility (France)
Andreas K. Freund, European Synchrotron Radiation Facility (France)
E. Lueken, European Synchrotron Radiation Facility (France)
Christian Riekel, European Synchrotron Radiation Facility (France)


Published in SPIE Proceedings Vol. 2011:
Multilayer and Grazing Incidence X-Ray/EUV Optics II
Richard B. Hoover, Editor(s)

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