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Proceedings Paper

Transmittance measurements for a variety of x-ray/EUV filter materials and pinhole leak measurements utilizing a new visible light photometer system
Author(s): Forbes R. Powell; James Fox
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Paper Abstract

This paper describes a new visible light photometer system and presents the results of a test program where visible light transmission has been measured for a variety of materials of varying thicknesses. From these measurements, equivalent absorption coefficients are presented for some of the materials commonly used in x-ray and extreme ultraviolet filters. Also presented are some criteria for quantifying light leaks through pinholes.

Paper Details

Date Published: 1 February 1994
PDF: 10 pages
Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); doi: 10.1117/12.167214
Show Author Affiliations
Forbes R. Powell, Luxel Corp. (United States)
James Fox, Luxel Corp. (United States)

Published in SPIE Proceedings Vol. 2011:
Multilayer and Grazing Incidence X-Ray/EUV Optics II
Richard B. Hoover, Editor(s)

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