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Proceedings Paper

Multilayered supermirror structures for hard x-ray synchrotron and astrophysics instrumentation
Author(s): Karsten Dan Joensen; Peter Hoghoj; Finn Erland Christensen; Paul Gorenstein; Jean Susini; Eric Ziegler; Andreas K. Freund; James L. Wood
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Paper Abstract

By varying the thickness of the layers in a multilayer down through the structure, it is possible to produce wide-band reflectors. We report measurements and modeling of the reflectivity of Ni/C, Mo/Si and W/Si supermirrors, at energies ranging from 8 to 130 keV, and discuss the performance of two possible applications: a Kirkpatrick-Baez telescope, and a multiwavelength hard X-ray focusing reflector. The supermirrors perform as expected, and model-fits over the full range have been attempted with some success. We conclude that the supermirror coatings do indeed look very promising as hard x-ray optics for synchrotron applications, while some work on highly nested structures and supermirror coatings on very thin large substrates is necessary, before the feasibility of employing large-area supermirrors for hard X-ray astronomy is determined.

Paper Details

Date Published: 1 February 1994
PDF: 13 pages
Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); doi: 10.1117/12.167210
Show Author Affiliations
Karsten Dan Joensen, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Peter Hoghoj, European Synchrotron Radiation Facility (France)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Paul Gorenstein, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Jean Susini, European Synchrotron Radiation Facility (France)
Eric Ziegler, European Synchrotron Radiation Facility (France)
Andreas K. Freund, European Synchrotron Radiation Facility (France)
James L. Wood, Ovonic Synthetic Materials Co. (United States)


Published in SPIE Proceedings Vol. 2011:
Multilayer and Grazing Incidence X-Ray/EUV Optics II
Richard B. Hoover, Editor(s)

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