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Proceedings Paper

High-resolution x-ray studies of an AXAF high-energy transmission grating
Author(s): Salim Abdali; Finn Erland Christensen; Herbert W. Schnopper; Thomas H. Markert; Daniel Dewey; Christie S. Nelson
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Paper Abstract

A triple axis X-ray diffractometer, designed and built at the Danish Space Research Institute, was used to make a high resolution study of the performance of a 2000 angstroms period, high energy X-ray transmission grating developed at MIT for one of the grating spectrometers on the Advanced X-ray Astrophysics Facility. Data was obtained at CuK(alpha )1 (8.048 keV) and, using single reflection asymmetric Si(044) crystals for both the monochromator and analyzer, an angular resolution of 1.5 arcsec FWHM was achieved. The efficiency of the grating in all orders up to the 15th was measured using a 12 kW rotating anode X-ray generator. These data provided the basis for a modelling of the grating structure.

Paper Details

Date Published: 1 February 1994
PDF: 10 pages
Proc. SPIE 2011, Multilayer and Grazing Incidence X-Ray/EUV Optics II, (1 February 1994); doi: 10.1117/12.167191
Show Author Affiliations
Salim Abdali, Danish Space Research Institute (Denmark)
Finn Erland Christensen, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Danish Space Research Institute (Denmark)
Thomas H. Markert, Massachusetts Institute of Technology (United States)
Daniel Dewey, Massachusetts Institute of Technology (United States)
Christie S. Nelson, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 2011:
Multilayer and Grazing Incidence X-Ray/EUV Optics II
Richard B. Hoover, Editor(s)

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