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Proceedings Paper

Characterization of porous silicon by microscopic Fourier transform infrared spectroscopy
Author(s): Adele Sassella; Alessandro Borghesi; B. Pivac; Lorenzo Pavesi
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Paper Abstract

Infrared absorption of luminescent porous silicon has been measured with high spatial resolution to study the local chemical composition. A few typical spectra, which evidence the presence of impurities such as H, O, and C in different bonding configurations, have been selected as the most significant and analyzed.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166806
Show Author Affiliations
Adele Sassella, Univ. di Pavia (Italy)
Alessandro Borghesi, Univ. di Modena (Italy)
B. Pivac, R. Boskovic Institute (Croatia)
Lorenzo Pavesi, Univ. of Trento (Italy)


Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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