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Proceedings Paper

Modeling the reflectivity of silicon
Author(s): J. A. Engelbrecht
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Paper Abstract

Various theoretical models have been proposed to simulate the reflectivity of silicon. These models were extrapolated to the infrared region, where a Drude model is also evaluated.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166805
Show Author Affiliations
J. A. Engelbrecht, Univ. of Port Elizabeth (South Africa)

Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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