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Proceedings Paper

Dynamic infrared spectroscopy with a fast scan FTIR spectrometer
Author(s): A. J. Turner; Robert A. Hoult
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Paper Abstract

A normal fast scanning FTIR spectrometer can be used to obtain dynamic IR spectra by using a technique where information on the sample strain is saved along with each interferogram reading. Software is then used to find correlations between the interferogram data and sample strain and hence extract the time dependent components in the data.

Paper Details

Date Published: 31 January 1994
PDF: 2 pages
Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166792
Show Author Affiliations
A. J. Turner, Perkin-Elmer Ltd. (United Kingdom)
Robert A. Hoult, Perkin-Elmer Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 2089:
9th International Conference on Fourier Transform Spectroscopy
John E. Bertie; Hal Wieser, Editor(s)

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